X-ray lensless microscopy from undersampled diffraction intensities

X-ray lensless microscopy from undersampled diffraction intensities

A scheme for lensless X-ray microscopy combining coherent diffraction imaging and differential corner holography.

We successfully use the corners of a common silicon nitride supporting window in lensless X-ray microscopy as extended references in differential holography to obtain a real space hologram of the illuminated object. Moreover, we combine this method with the iterative phasing techniques of coherent diffraction imaging to enhance the spatial resolution on the reconstructed object, and overcome th...

X-Ray Diffraction and Scanning Probe Microscopy

Diffraction can occur when electromagnetic radiation interacts with a periodic structure whose repeat distance is about the same as the wavelength of the radiation. Visible light, for example, can be diffracted by a grating that contains scribed lines spaced only a few thousand angstroms apart, about the wavelength of visible light. X-rays have wavelengths on the order of angstroms, in the rang...

High resolution 3D x-ray diffraction microscopy.

We have imaged a 2D buried Ni nanostructure at 8 nm resolution using coherent x-ray diffraction and the oversampling phasing method. By employing a 3D imaging reconstruction algorithm, for the first time we have experimentally determined the 3D structure of a noncrystalline nanostructured material at 50 nm resolution. The 2D and 3D imaging resolution is currently limited by the exposure time an...

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...